@misc{Kozubal_Michał_Identyfikacja_2013,
 author={Kozubal Michał},
 volume={41},
 number={1},
 copyright={Rights Reserved - Free Access},
 journal={Electronic Materials},
 address={Warszawa},
 howpublished={online},
 year={2013},
 publisher={ITME},
 language={pol},
 title={Identyfikacja centrów defektowych w warstwach epitaksjalnych 4H-SiC = Identification of defect centers in 4H-SiC epitaxial layers},
 type={Text},
 URL={http://rcin.org.pl/Content/36207/PDF/WA901_r2013-t41-z1_Mater-Elektron-Kozu_i.pdf},
 keywords={point defects, deep traps, DLTS, SiC, electron irradiation},
}