@misc{Sass_Jerzy_Analiza_1994,
 author={Sass Jerzy},
 volume={22},
 number={4},
 copyright={Rights Reserved - Free Access},
 address={Warszawa},
 journal={Electronic Materials},
 howpublished={online},
 year={1994},
 publisher={ITME},
 language={pol},
 type={Text},
 title={Analiza możliwości zastosowania wysokorozdzielczej dyfraktomaterii rentgenowskiej do badań parametrów strukturalnych warstw epitaksjalnych i supersieci = The possibility of application of high resolution x-ray diffraction for determination the structural parameters of epilayers and superlattices},
 URL={http://rcin.org.pl/Content/14651/PDF/WA901_14632_M1_r1994-t22-z4_Mater-Elektron-Sass_i.pdf},
 keywords={Electronic - materials, Electronic - journal - materials, HR XRD, epitaxial layer, superlattice},
}