@misc{Roszkiewicz_Krzysztof_Pomiar_1981,
 author={Roszkiewicz Krzysztof},
 volume={29},
 editor={Brzozowski Andrzej},
 number={1},
 copyright={Rights Reserved - Free Access},
 address={Warszawa},
 journal={Electronic Materials},
 howpublished={online},
 year={1981},
 publisher={Wydaw. Przemysłu Maszynowego "WEMA"},
 language={pol},
 type={Text},
 title={Pomiar rozkładu fosforu w warstwach epitaksjalnych GaAs1-xPx w oparciu o efekt fotowoltaiczny = Phosphorus contents profile measurement in GaAs1-xPx epitaxial layers, based on photovoltaic phenomenon},
 URL={http://rcin.org.pl/Content/18550/PDF/WA901_11682_M1_r1980-z1-29_Mater-Elektron-Rosz_i.pdf},
 keywords={Electronic - journal - materials, Electronic - materials, phosphorus concentration, GaAsP, photovoltaic phenomenon},
}