@misc{Sikorski_Krzysztof_Mikroanaliza_1983,
 author={Sikorski Krzysztof},
 editor={Szummer Krzysztof},
 number={8},
 copyright={Rights Reserved - Free Access},
 address={Warszawa},
 journal={Proceedings of ITME},
 howpublished={online},
 year={1983},
 publisher={Wydaw. Przem. Masz. "WEMA"},
 language={pol},
 type={Text},
 title={Mikroanaliza rentgenowska cienkich warstw = X-ray microanalysis of thin films},
 URL={http://rcin.org.pl/Content/30149/PDF/WA901_17734_r1983-z8_Prace-ITME-Sikor_i.pdf},
 keywords={Electronic - journal - material, Electronic materials, x-ray microanalysis, thin film},
}