@misc{Jóźwik_Iwona_Scanning_2016,
 author={Jóźwik Iwona},
 volume={44},
 editor={Instytut Technologii Materiałów Elektronicznych. Wyd.},
 number={2},
 copyright={Rights Reserved - Free Access},
 address={Warsaw},
 journal={Materiały Elektroniczne - Electronic Materials},
 howpublished={online},
 year={2016},
 publisher={ITME},
 language={eng},
 type={Text},
 title={Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers Iwona Jóźwik.},
 URL={http://rcin.org.pl/Content/63366/PDF/ME_2_16_Jozwik.pdf},
 keywords={Graphene, Graphene characterization, Low-kV scanning electron microscopy},
}