RCIN and OZwRCIN projects

Object

Title: Badanie odkształceń sieci krystalicznej w implantowanej warstwie epitaksjalnej GaN osadzonej metodą MOCVD na podłożu szafirowym o orientacji [001] = Lattice strain study in implanted GaN epitaxial layer deposited by means of MOCVD technique on [001] oriented sapphire substrate

Object collections:

Last modified:

Oct 2, 2020

In our library since:

May 14, 2013

Number of object content downloads / hits:

1028

All available object's versions:

https://rcin.org.pl/publication/17062

Show description in RDF format:

RDF

Show description in RDFa format:

RDFa

Show description in OAI-PMH format:

OAI-PMH

Objects Similar

×

Citation

Citation style:

This page uses 'cookies'. More information