Institute of Electronic Materials Technology

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Wyznaczenie wybranych parametrów piezoelektrycznych kryształu SrLaGa3O7 = Determination of selected parameters in SrLaGa3O7 crystal

Sadura Jolanta

2013

Text

Poprawa jakości polerowanych płytek SiC metodą chemicznego utleniania i obróbki termicznej. Badania jakości powierzchni metodami rentgenowskimi = Improvement of the quality of SiC wafers polished using chemical oxidation and heat treatment. Examination of the quality of the surface using X-ray technoques

Sakowska Halina

2012

Text

Defekty wzrostowe w kryształach granatu gadolinowo-galowego = Growth defects in single crystals of gadolinium gallium garnet

Naumowicz Piotr

1984

Text

Investigation of oxide crystals by means of synchrotron and conventional X-raydiffraction topography Wojciech Wierzchowski, Agnieszka Malinowska, Krzysztof Wieteska, Edyta Wierzbicka, Krystyna Mazur, Maria Lefeld - Sosnowska, Marek Świrkowicz, Tadeusz Łukasiewicz.

Wierzchowski Wojciech

2016

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