Title:

Zastosowanie metody mikroanalizy rentgenowskiej do badania składu chemicznego warstw epitaksjalnych związków potrójnych grupy AIIIBV na przykładzie GA1-xAlxAs = X-ray microanalysis application for the investigation of epitaxial layer chemical composition of AIIIBV group triple compounds with the Ga1-x\alx\as as a representative of this group

Subtitle:

Materiały Elektroniczne 1974 nr 8

Creator:

Kozłowska Halina

Contributor:

Senkara Jacek

Publisher:

Wydaw. Przemysłu Maszynowego "WEMA"

Place of publishing:

Warszawa

Date issued/created:

1974

Description:

s. 18-30 : il. ; 24 cm. ; Bibliogr. s. 29-30

Subject and Keywords:

Electronic - materials ; Electronic - journal - materials ; x-ray microanalysis ; epitaxial layer ; chemical composition ; AIIIBV

Relation:

Electronic Materials

Issue:

8

Start page:

18

End page:

30

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

ITME, sygn. dostępny ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open