Title:

Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers Iwona Jóźwik.

Subtitle:

Skaningowy mikroskop elektronowy pracujący w zakresie niskich wartości napięcia przyspieszającego jako unikatowe narzędzie do charakteryzacji warstw grafenu

Creator:

Jóźwik Iwona

Contributor:

Instytut Technologii Materiałów Elektronicznych. Wyd.

Publisher:

ITME

Place of publishing:

Warsaw

Date issued/created:

2016

Description:

References: p.: 15-16 ; p.: 11-16, il. 30 cm.

Subject and Keywords:

Graphene ; Graphene characterization ; Low-kV scanning electron microscopy

References:

15-16

Relation:

Materiały Elektroniczne - Electronic Materials

Volume:

44

Issue:

2

Start page:

11

End page:

16

Resource type:

Text

Detailed Resource Type:

Article

Format:

A4 ; application/pdf

Source:

click here to follow the link

Language:

eng

Language of abstract:

eng

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

European Union. European Regional Development Fund ; Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure

Access:

Open