Instytut Technologii Materiałów Elektronicznych. Wyd.
References: p.: 15-16 ; p.: 11-16, il. 30 cm.
15-16
Materiały Elektroniczne - Electronic Materials
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Institute of Electronic Materials Technology
Library of the Electronic Materials Technology Institute
European Union. European Regional Development Fund ; Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure
Mar 30, 2021
Oct 18, 2017
203
https://rcin.org.pl/publication/83005
Edition name | Date |
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Jóźwik Iwona, Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers | Mar 30, 2021 |
Jóźwik, Iwona
Stańczyk Beata
Podniesiński Dariusz
Stańczyk Beata
Strachowski Tomasz